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For Windows XP, 7, 8 and 10.  32 and 64 bits


About  XPowder                          XPowder In The World:   Scholar Google   Google  UGR  Sciences   FreeFullPDF   dogpile   Springer   Elsevier  

This software has been developed for the analysis of natural minerals, artificial compounds, biological crystals and other solid materials, using techniques of Powder X-Ray Diffraction (PXRD). Main applications are the identification, quantification and characterization of the crystalline components of solid samples.

XPowder is intended for professionals, researchers and teachers of the following activities:                                                               Order form

• Works of Art (Painting and Sculpture)

• Manuscripts

• Pigments

Drilling and Oil Industry

• Cements

• QA

Mineralogy and Crystallography


• Drugs

Chemical Industry

• Pharmaceutical

• Zeolites

• Industrial Crystallization

• Environment

• Explosives

• Corrosion and Alteration Products

• Cultural Heritage

• Clays

• Meteorites and Space

• Novel Materials

• Forensic

• Metallurgy

• Polymers

• Detergents

• Mining

• Quarries

• Educational


Current XPowderX software (ver 2016)  can coexist with the predecessors XPowder and XPowder12 and all of them can share the same computer, databases and sample files.

XPowderX free download setup files                                        

xpowderx_setup.exe      (User guide)

xpowderx_setup_exe.txt (it is the ‘xpowderx_setup.exe’ file with the extension txt to prevent your antivirus from stopping the download. If ‘xpowderx_setup.exe’ was not downloaded, rename ‘xpowderx_setup.exe.txt’ as ‘xpowderx_setup.exe’).

Setup files of old discontinued software XPowder and XPowder12

xpowder_setup.exe          (User guide)

xpowder12_setup.exe      (User guide)

Database access

This software can access several databases.

• AMSCD free Mineral database.
• PDF2.DAT database of the ‘The International Centre for Diffraction Data (ICDD)’
• P2D2  (Predicted Powder Diffraction Database).The P2D2 free database currently includes twelve text files, each one with approximately 100000 framework structure compounds, which can be automatically indexed by XPowder, individually or combined for search-match analysis.
• Custom databases directly created by the user or imported from other databases ("My database").

Databases are not included in XPowder setup programs and they have to be acquired by user.

• User-friendly tools  grouped in tabs
• Batch job to manage fifty diffractograms simultaneously.
• Input data format compatibility  (Bruker Raw, Philips RD, UXD, UDX, UDF, POW, GSA, Xpert, Cerius GRF, x-y, PLV, XYe (Mercury), Sietronic (cpi), Seifert(nja), MDI, Rigaku (rig), Chemin images of Curiosity Mars Rover only in XPowder12...).
• Automatic  background subtraction.
• Data smoothing (Exponential and Fourier filtering).
• Free  Δ2θº step choice. 
• Reciprocal space histogram generation from common ‘2
qº/counts’  format
• K
α2 and Kβ stripping.
• Linear and non-linear 2
θ offset corrections using internal standard or harmonic methods.
Unit-cell refinement and space-group determination tools.
• Undo / redo / reload / unload. 
• Pattern merging.
• Thermal coefficients.
• Plots:  
Single patternsPile and 2D maps


• Search/Match phase identification using the ICDD Powder Diffraction File (PDF2),  AMCSDP2D2  and Customized databases.
• Display stick, hkl-index and information for database patterns.
• Boolean searching [(Name (And, And, And) + 
Chemical (And, Or, Not] +  subfiles + pdf2 deleted patterns) or AMCSD code.


Quantitative.  Two methods can be optionally used:

• LS pattern experimental patterns fitting to database crystalline records. Intensities and some parameters ( i.e. peak position and absorption correction) are fitted.  XPowderX applies Normalized Methods using RIR (Reference Intensity Ratio) database values or customized PIR (Pattern Reference Intensity) measured values.

• The relative mixtures of full-profile from experimental or calculated diffractograms of pure phases are used to simulate that of the problem sample using minimal squares methods. Scale factor is calculated using Normalized PIR Methods. Intensities are corrected by some fitting parameters, i.e. Single Peak Displacements, 2θ Zero-ShiftProfile Broadening and Absorption.  Result includes ComponentsComputed patterns, Difference diffractogram and compositional table.

In both methods According R-Factor and Standard deviations are computed. 


Profile Analysis
Pseudo-Voigt, Gaussian, Cauchy and Pearson VII asymmetric models.
 Instrumental corrections. Calculation of profile parameters such as FWMHIntegral BroadeningForm FactorAsymmetryX-Size and Strain (Williamson-Hall and Fourier Warren-Averbach methods), Log-Normal crystal size distribution, Integral CountsKa2Background and Instrumental Broadening correctionsCaglioti function computation, etc..

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Sales representative: J Daniel Martin-Islán. XPowder Software.  Ronda 101. Atalaya 1-  2ºA. 18003 GRANADA (Spain).